A scanning transmission x-ray microscope for materials science spectromicroscopy at the advanced light source

Citation:

T. Warwick, K Franck, JB Kortright, G Meigs, M Moronne, SCB Myneni, E Rotenberg, S Seal, and WF Steele. 1998. “A scanning transmission x-ray microscope for materials science spectromicroscopy at the advanced light source.” Review of Scientific Instruments 69: 2964-2973.

Abstract:

Design and performance of a scanning transmission x-ray microscope (STXM) at the Advanced Light Source is described. This instrument makes use of a high brightness undulator beamline and extends the STXM technique to new areas of research. After 2.5 years of development it is now an operational tool for research in polymer science, environmental chemistry, and magnetic materials.

DOI
Keywords:
X-ray microscopes; Magnetic materials; Materials science; Polymers; Brightness