Soft X-ray microscopy and spectroscopy at the molecular environmental science beamline at the Advanced Light Source

Citation:

Bluhm H., K Andersson, T Araki, K Benzerara, GE Brown, JJ Dynes, S Ghosal, Mk Gilles, H-C Hansed, JC Heminger, AP Hitchcock, G Ketteler, ALD Kilcoyne, E Kneedler, JR Lawrence, GG Leppard, J Majzlan, BS Mun, SCB Myneni, A Nilsson, H Ogasawara, DF Ogletree, K Pecher, M Salmeron, DK Shuh, B Tonner,  T Tyliszczak, T Warwick, and TH Yoon. 2005. “Soft X-ray microscopy and spectroscopy at the molecular environmental science beamline at the Advanced Light Source.” Journal of Electron Spectroscopy and Related Phenomena 150: 86 - 104.

Abstract:

We present examples of the application of synchrotron-based spectroscopies and microscopies to environmentally relevant samples. The experiments were performed at the molecular environmental science beamline (11.0.2) at the Advanced Light Source, Lawrence Berkeley National Laboratory. Examples range from the study of water monolayers on Pt(1 1 1) single crystal surfaces using X-ray emission spectroscopy and the examination of alkali halide solution/water vapor interfaces using ambient pressure photoemission spectroscopy, to the investigation of actinides, river water biofilms, Al-containing colloids and mineral–bacteria suspensions using scanning transmission X-ray spectromicroscopy. The results of our experiments show that spectroscopy and microscopy in the soft X-ray energy range are excellent tools for the investigation of environmentally relevant samples under realistic conditions, i.e., with water or water vapor present at ambient temperature.

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